XPS, AES AND LEED STUDIES OF CU DEPOSITED ON CR2O3(0001) SURFACES

Authors
GUO QL GUI LL MOLLER PJ BINAU K
Citation
Ql. Guo et al., XPS, AES AND LEED STUDIES OF CU DEPOSITED ON CR2O3(0001) SURFACES, Applied surface science, 92, 1996, pp. 513-518
Citations number
17
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
Applied surface science → ACNP
ISSN journal
01694332
Volume
92
Year of publication
1996
Pages
513 - 518
Database
ISI
SICI code
0169-4332(1996)92:<513:XAALSO>2.0.ZU;2-4
Abstract
The interaction between ultrathin layers of Cu and Cr2O3(0001) surface s was studied by X-ray photoelectron spectroscopy (XPS), Auger electro n spectroscopy and low-energy electron diffraction (LEED). The XPS res ults indicate that copper deposited on the Cr2O3(0001) surfaces is ini tially in a Cu(I) state, and an agglomeration of copper on the Cr2O3(0 01)-1 x 1 surface was seen with increasing copper coverage. A Cu(111)R 30 degrees/Cr2O3(0001)-1 x 1 epitaxial relationship was observed by LE ED.