TEM AND HRTEM CROSS-SECTION INVESTIGATIONS OF THE MICROSTRUCTURE OF YBA2CU3O7-X THIN-FILMS ON ORIENTED NIO SINGLE-CRYSTALS

Citation
Jh. Muller et al., TEM AND HRTEM CROSS-SECTION INVESTIGATIONS OF THE MICROSTRUCTURE OF YBA2CU3O7-X THIN-FILMS ON ORIENTED NIO SINGLE-CRYSTALS, Physica. C, Superconductivity, 210(1-2), 1993, pp. 173-178
Citations number
11
Categorie Soggetti
Physics, Applied
ISSN journal
09214534
Volume
210
Issue
1-2
Year of publication
1993
Pages
173 - 178
Database
ISI
SICI code
0921-4534(1993)210:1-2<173:TAHCIO>2.0.ZU;2-2
Abstract
Thin films of YBa2Cu3O7-x were grown on (1 00) and (11 0) oriented NiO single crystals by magnetron sputter deposition from a stoichiometric (Y:Ba:Cu= 1:2:3) tubular target. The properties of these films were i nvestigated by electron microscopy. For the TEM investigation, cross s ections were prepared by cross section preparation. The crystal struct ures of YBa2Cu3O7-x filMs show remarkable defects. The interface YBa2C u3O7-x/NiO is clearly visible in some highly resolved micrographs. The electron diffraction patterns and micrograph contrasts of some areas of these films indicate the Y2BaCuO5 structure.