Jh. Muller et al., TEM AND HRTEM CROSS-SECTION INVESTIGATIONS OF THE MICROSTRUCTURE OF YBA2CU3O7-X THIN-FILMS ON ORIENTED NIO SINGLE-CRYSTALS, Physica. C, Superconductivity, 210(1-2), 1993, pp. 173-178
Thin films of YBa2Cu3O7-x were grown on (1 00) and (11 0) oriented NiO
single crystals by magnetron sputter deposition from a stoichiometric
(Y:Ba:Cu= 1:2:3) tubular target. The properties of these films were i
nvestigated by electron microscopy. For the TEM investigation, cross s
ections were prepared by cross section preparation. The crystal struct
ures of YBa2Cu3O7-x filMs show remarkable defects. The interface YBa2C
u3O7-x/NiO is clearly visible in some highly resolved micrographs. The
electron diffraction patterns and micrograph contrasts of some areas
of these films indicate the Y2BaCuO5 structure.