LARGE EXCHANGE BIAS AND ITS CONNECTION TO INTERFACE STRUCTURE IN FEF2-FE BILAYERS

Citation
J. Nogues et al., LARGE EXCHANGE BIAS AND ITS CONNECTION TO INTERFACE STRUCTURE IN FEF2-FE BILAYERS, Applied physics letters, 68(22), 1996, pp. 3186-3188
Citations number
17
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
68
Issue
22
Year of publication
1996
Pages
3186 - 3188
Database
ISI
SICI code
0003-6951(1996)68:22<3186:LEBAIC>2.0.ZU;2-K
Abstract
Large exchange bias effects (Delta E similar to 1.1 erg/cm(2)) were ob served in antiferromagnetic (FeF2)-ferromagnetic (Fe) bilayers grown o n MgO. The FeF2 grows along the spin-compensated (110) direction. The FeF2-Fe interface roughness was characterized using specular and diffu se x-ray diffraction and atomic force microscopy. The magnitude of the exchange bias field H-E increases as the interface roughness decrease s. These results imply that magnetic domain creation in the antiferrom agnet plays an important role. (C) 1996 American Institute of Physics.