J. Nogues et al., LARGE EXCHANGE BIAS AND ITS CONNECTION TO INTERFACE STRUCTURE IN FEF2-FE BILAYERS, Applied physics letters, 68(22), 1996, pp. 3186-3188
Large exchange bias effects (Delta E similar to 1.1 erg/cm(2)) were ob
served in antiferromagnetic (FeF2)-ferromagnetic (Fe) bilayers grown o
n MgO. The FeF2 grows along the spin-compensated (110) direction. The
FeF2-Fe interface roughness was characterized using specular and diffu
se x-ray diffraction and atomic force microscopy. The magnitude of the
exchange bias field H-E increases as the interface roughness decrease
s. These results imply that magnetic domain creation in the antiferrom
agnet plays an important role. (C) 1996 American Institute of Physics.