EVALUATION OF THE MEMORY KERNEL FOR FLUCTUATION DECAY IN SIMULATED GLASS-FORMING NI0.5ZR0.5 LIQUIDS

Authors
Citation
H. Teichler, EVALUATION OF THE MEMORY KERNEL FOR FLUCTUATION DECAY IN SIMULATED GLASS-FORMING NI0.5ZR0.5 LIQUIDS, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 53(5), 1996, pp. 4287-4290
Citations number
20
Categorie Soggetti
Physycs, Mathematical","Phsycs, Fluid & Plasmas
ISSN journal
1063651X
Volume
53
Issue
5
Year of publication
1996
Part
A
Pages
4287 - 4290
Database
ISI
SICI code
1063-651X(1996)53:5<4287:EOTMKF>2.0.ZU;2-Y
Abstract
Molecular dynamics simulations for undercooled glass-forming Ni0.5Zr0. 5 liquids are analyzed to evaluate the memory kernel that governs the decay of structural fluctuations according to the schematic model of t he mode coupling theory. The resulting kernel exhibits significant str uctures which explains the absence of the inverse power law decay in t he early beta regime.