LOCAL ELASTICITY MEASUREMENT ON POLYMERS USING ATOMIC-FORCE MICROSCOPY

Local elasticity was measured on polymers by modifying atomic force mi croscopy (AFM) in which the sample height was modulated and the respon se of the cantilever was detected. Tn a case of polystyrene (PS) on mi ca, there existed many circular holes in the film that were stiffer th an the rest parts. The holes were identified as the substrate mica sur face and the rest as PS films. In the case of a polyethyleneoxide surf ace on mica, a crystalline nature was observed. In addition, the surfa ce was modified by scanning an AFM tip at large forces of 20 nN. The s canned area exhibited an increase in elasticity as well as formation o f a striped structure.