LOCAL ELASTICITY MEASUREMENT ON POLYMERS USING ATOMIC-FORCE MICROSCOPY

Citation
Hy. Nie et al., LOCAL ELASTICITY MEASUREMENT ON POLYMERS USING ATOMIC-FORCE MICROSCOPY, Thin solid films, 273(1-2), 1996, pp. 143-148
Citations number
15
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
273
Issue
1-2
Year of publication
1996
Pages
143 - 148
Database
ISI
SICI code
0040-6090(1996)273:1-2<143:LEMOPU>2.0.ZU;2-E
Abstract
Local elasticity was measured on polymers by modifying atomic force mi croscopy (AFM) in which the sample height was modulated and the respon se of the cantilever was detected. Tn a case of polystyrene (PS) on mi ca, there existed many circular holes in the film that were stiffer th an the rest parts. The holes were identified as the substrate mica sur face and the rest as PS films. In the case of a polyethyleneoxide surf ace on mica, a crystalline nature was observed. In addition, the surfa ce was modified by scanning an AFM tip at large forces of 20 nN. The s canned area exhibited an increase in elasticity as well as formation o f a striped structure.