A Si-doped GaN layer was grown by MOVPE (metal-organic vapor phase epi
taxy) using tetraethylsilane (TeESi) as the dopant. The Hall effect wa
s studied between 11 K and 300 K. The electron concentration was obser
ved to increase with the increase in the TeESi flow rate. The activati
on energy E(D) for ionization of shallow donors was determined to be 2
7 meV.