B. Eisenhut et al., GROWTH AND STRUCTURE OF AG ON PD(111) STUDIED BY PHOTOELECTRON FORWARD SCATTERING USING A 2-DIMENSIONAL DISPLAY-TYPE ANALYZER, Physical review. B, Condensed matter, 47(19), 1993, pp. 12980-12983
For an investigation of the growth and the structure of thin Ag films
on Pd(111), the angular distribution of core-level photoelectrons emit
ted at high kinetic energy (> 500 eV) was measured with a two-dimensio
nal display-type electron spectrometer. At room temperature, Ag grows
epitaxially on Pd(111) in the layer-by-layer mode. The Ag films have f
cc crystal structure and grow with a stacking fault at the interface r
elative to the Pd(111) substrate. Low-energy electron-diffraction-inte
nsity measurements show that the first Ag layer is pseudomorphic with
the Pd(111) substrate and the stacking fault occurs between the first
and the second Ag layers.