Qj. Xing et al., EFFECT OF RAPID THERMAL ANNEALING ON THE OPTICAL AND STRUCTURAL-PROPERTIES OF HIGHLY STRAINED INAS INP QUANTUM-WELL STRUCTURES/, Solid state communications, 98(11), 1996, pp. 1009-1013
The effect of rapid thermal annealing on the photoluminescence and x-r
ay diffraction characteristics of a highly strained InAs/InP single qu
antum well structure grown by low-pressure metalorganic chemical vapor
deposition has been investigated, Rapid thermal annealing has been fo
und to significantly improve the crystalline quality of the strained I
nAs/InP single quantum well structure. The luminescence intensity of t
he quantum well at 8 K was increased by a factor of 4 after annealing
at 700 degrees C for 5 s. The results obtained by high-resolution x-ra
y diffractometry have demonstrated no noticeable change of the structu
re in samples annealed at lower temperatures (below 750 degrees C). At
higher temperatures, rapid thermal annealing deteriorated the x-ray d
iffraction characteristics, and also reduced the quantum well luminesc
ence efficiency. Furthermore, we found that the luminescence efficienc
y of the deep radiative levels in the samples were also affected by ra
pid thermal annealing. Copyright (C) 1996 Published by Elsevier Scienc
e Ltd