INSTABILITIES OF CURRENT DISTRIBUTION ON SURFACE IN SILICON AUGER-TRANSISTOR WITH TUNNEL MOS-EMITTERS

Authors
BELOV SV VEKSLER MI GREKHOV IV SHULEKIN AF
Citation
Sv. Belov et al., INSTABILITIES OF CURRENT DISTRIBUTION ON SURFACE IN SILICON AUGER-TRANSISTOR WITH TUNNEL MOS-EMITTERS, Pis'ma v Zurnal tehniceskoj fiziki, 22(3), 1996, pp. 42-47
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
Pis'ma v Zurnal tehniceskoj fiziki → ACNP
ISSN journal
03200116
Volume
22
Issue
3
Year of publication
1996
Pages
42 - 47
Database
ISI
SICI code
0320-0116(1996)22:3<42:IOCDOS>2.0.ZU;2-3