DETERMINATION OF THE COMPOSITION OF ION-I MPLANTED MGO SURFACE-LAYERSBY THE RUTHERFORD AND RESONANCE ION BACKSCATTERING METHOD

Authors
ZAVODCHIKOV VM KOBZEV AP KRYUCHKOV YY PICHUGIN VF SOKHOREVA VV FRANGULYAN TS
Citation
Vm. Zavodchikov et al., DETERMINATION OF THE COMPOSITION OF ION-I MPLANTED MGO SURFACE-LAYERSBY THE RUTHERFORD AND RESONANCE ION BACKSCATTERING METHOD, Pis'ma v Zurnal tehniceskoj fiziki, 22(1), 1996, pp. 7-11
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
Pis'ma v Zurnal tehniceskoj fiziki → ACNP
ISSN journal
03200116
Volume
22
Issue
1
Year of publication
1996
Pages
7 - 11
Database
ISI
SICI code
0320-0116(1996)22:1<7:DOTCOI>2.0.ZU;2-4