SOME NEW OPTICAL MEASUREMENT TECHNIQUES FOR THE STUDY OF CRYSTAL-GROWTH AND ELECTRODE PROCESSES

This paper discusses some new optical measurement techniques for the s tudy of crystal growth and electrode processes, namely, holographic ph ase-contrast interferometric microphotography (HPCIM), phase conjugati on interferometry (PCI) and laser diffractometry. Using these techniqu es, real-time crystal growth and electrode processes can be observed; solid-liquid interface boundary layers and the crystal surface morphol ogy can be studied quantitatively and solution saturation and crystal growth rates can be measured precisely. These techniques are also comp ared with other methods.