I-DDQ TEST INVALIDATION BY BREAK FAULTS

Authors
DALPASSO M FAVALLI M OLIVO P
Citation
M. Dalpasso et al., I-DDQ TEST INVALIDATION BY BREAK FAULTS, Electronics Letters, 32(11), 1996, pp. 994-995
Citations number
10
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
32
Issue
11
Year of publication
1996
Pages
994 - 995
Database
ISI
SICI code
0013-5194(1996)32:11<994:ITIBBF>2.0.ZU;2-G
Abstract
The effectiveness of I-DDQ testing for bridging faults in CMOS ICs can be decreased if break faults are present in the circuit. The robustne ss to such invalidation is investigated here, leading to claims for a better rest pattern generation for I-DDQ testing. As for the proposed solution, test vectors that activate a larger number of different curr ent paths can build a more robust test sequence.