Pk. Rastogi, MEASUREMENT OF CURVATURE AND TWIST OF A DEFORMED OBJECT BY ELECTRONICSPECKLE-SHEARING PATTERN INTERFEROMETRY, Optics letters, 21(12), 1996, pp. 905-907
Electronic speckle-shearing pattern interferometry is applied to yield
whole-field phase maps corresponding to the curvature and twist distr
ibutions of a deformed specimen. (C) 1996 Optical Society of America