CORRELATION OF PHOTON-EMISSION WITH ELECTRIC-FIELD-INITIATED NANOMETER-SCALE SURFACE MODIFICATION

Authors
STROZEWSKI KJ MCBRIDE SE WETSEL GC
Citation
Kj. Strozewski et al., CORRELATION OF PHOTON-EMISSION WITH ELECTRIC-FIELD-INITIATED NANOMETER-SCALE SURFACE MODIFICATION, Journal of applied physics, 79(11), 1996, pp. 8638-8642
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
79
Issue
11
Year of publication
1996
Pages
8638 - 8642
Database
ISI
SICI code
0021-8979(1996)79:11<8638:COPWEN>2.0.ZU;2-F
Abstract
Photon emission during electric-field-initiated material transfer has been measured using a scanning tunneling microscope configured for sur face modification. The instrument has been integrated with a photon-co unting system that measures the emission originating from the tip-samp le junction under both quiescent and transient conditions. The transie nt photon emission recorded during nanometer-scale surface modificatio n of gold samples is correlated with the type of feature formed on the sample surface. (C) 1996 American Institute of Physics.