LOW-TEMPERATURE FABRICATION OF HIGH DIELECTRIC-CONSTANT THIN-FILM CAPACITOR ON GAAS-MMIC

Citation
M. Kitagawa et al., LOW-TEMPERATURE FABRICATION OF HIGH DIELECTRIC-CONSTANT THIN-FILM CAPACITOR ON GAAS-MMIC, Journal of the Korean Physical Society, 29, 1996, pp. 582-586
Citations number
8
Categorie Soggetti
Physics
ISSN journal
03744884
Volume
29
Year of publication
1996
Supplement
S
Pages
582 - 586
Database
ISI
SICI code
0374-4884(1996)29:<582:LFOHDT>2.0.ZU;2-D
Abstract
It succeeded in the development in highly efficient capacitor for micr owave monolithic integrated circuit (MMIC) by forming high dielectric constant materials of the SrTiO3 system at low temperature deposition using the reactive sputtering method. In the past, the integration by making monolithic about this material was difficult because the fabric ation temperature was high (about 450 degrees C). Therefore, to realiz e it, the low temperature process and the high precision process which fitted in with the mass production were necessary. In this study, it developed sputtering technology which it is possible to deposit at the low temperature of about 200 degrees C in SrTiO3 which shows the diel ectric characteristic to be excellent to frequency 3 GHz over.