SCANNING-TUNNELING-MICROSCOPY STUDY OF INP(001) SURFACES PREPARED BY UHV DECAPPING OF METAL-ORGANIC VAPOR-PHASE-EPITAXY-GROWN SAMPLES

Citation
N. Esser et al., SCANNING-TUNNELING-MICROSCOPY STUDY OF INP(001) SURFACES PREPARED BY UHV DECAPPING OF METAL-ORGANIC VAPOR-PHASE-EPITAXY-GROWN SAMPLES, Physical review. B, Condensed matter, 53(20), 1996, pp. 13257-13259
Citations number
15
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
53
Issue
20
Year of publication
1996
Pages
13257 - 13259
Database
ISI
SICI code
0163-1829(1996)53:20<13257:SSOISP>2.0.ZU;2-4
Abstract
In this study we report on an investigation of the microscopic structu re of InP(001) surfaces grown by metal-organic vapor-phase epitaxy (MO VPE). InP(001) homoepitaxial layers were grown in a MOVPE reactor and capped in situ with a P/As sandwich layer by photodecomposition of the phosphine and arsine precursors in the gas phase. The passivated samp les were transferred through atmosphere into a separate UHV system. Af ter thermal desorption of the capping layers, a clear (2X4) LEED patte rn was achieved. STM images show large, flat surface areas. Images wit h atomic resolution reveal a (2X4) surface structure corresponding to an In-rich surface. The microscopic surface structure is discussed in the light of recently proposed structure models.