GROWTH OF PEROVSKITE-TYPE THIN-FILMS BY MBE

Citation
Y. Yoneda et al., GROWTH OF PEROVSKITE-TYPE THIN-FILMS BY MBE, Journal of the Korean Physical Society, 29, 1996, pp. 652-655
Citations number
8
Categorie Soggetti
Physics
ISSN journal
03744884
Volume
29
Year of publication
1996
Supplement
S
Pages
652 - 655
Database
ISI
SICI code
0374-4884(1996)29:<652:GOPTBM>2.0.ZU;2-M
Abstract
Epitaxial ultrathin films of BaTiO3 have been prepared using molecular beam epitaxy on SrTiO3 (001) substrate. Since growth condition of the se films was controlled as well as semiconductive film growth, the BaT iO3 films were characterized by X-ray diffraction even in the ultrathi n range. The ultrathin BaTiO3 films were tetragonal phase and highly c -axis oriented single crystal of good film quality. Their tetragonalit y was much larger than the bulk value of BaTiO3, and decreases with in creasing thickness. The epitaxial effect is discussed in terms of a cr itical thickness, as well as a fully strained layer of fine particles.