Ye. Roginskaya et al., X-RAY-DIFFRACTION, TRANSMISSION ELECTRON-MICROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPIC CHARACTERIZATION OF IRO2+TA2O5 FILMS, Journal of the Chemical Society. Faraday transactions, 89(11), 1993, pp. 1707-1715
Citations number
28
Categorie Soggetti
Chemistry Physical","Physics, Atomic, Molecular & Chemical
X-Ray diffraction (XRD), transmission electron microscopy (TEM), and X
-ray photoelectron spectroscopy (XPS) have been used to characterize I
rO2 + Ta2O5 films prepared from chloride solutions heated at 450-750-d
egrees-C. Coatings with IrO2 contents greater-than-or-equal-to 30 mol%
contain crystalline IrO2 and one or two additional rutile phases with
very diffuse XRD lines, as well as amorphous Ta2O5 which crystallizes
above 750-degrees-C. The rutile phases appear to be ultradisperse IrO
2 crystallites whose boundaries are appreciably modified by Ta2O5: the
finer the crystallites the more the contribution of this mixed modifi
ed phase. XPS shows that the surface of the films is enriched with tan
talum, the contribution of the mixed Ir + Ta oxide phase being display
ed in the XPS peaks by the broadening and the asymmetry change of the
core level of the Ir 4f and Ta 4f lines. This morphology of Ir + Ta ox
ide films is a result of hydrolytic processes in the solutions of the
precursors. Ta colloidal and polymeric species (gel) interact with Ir
chloride complexes at the surface, while the rest of the solution is d
ispersed into macro- and micro-pores of the gel structure.