ANALYSIS OF FRACTAL SURFACES USING SCANNING PROBE MICROSCOPY AND MULTIPLE-IMAGE VARIOGRAPHY .2. RESULTS ON FRACTAL AND NONFRACTAL SURFACES,OBSERVATION OF FRACTAL CROSSOVERS, AND COMPARISON WITH OTHER FRACTAL ANALYSIS TECHNIQUES
Jm. Williams et Tp. Beebe, ANALYSIS OF FRACTAL SURFACES USING SCANNING PROBE MICROSCOPY AND MULTIPLE-IMAGE VARIOGRAPHY .2. RESULTS ON FRACTAL AND NONFRACTAL SURFACES,OBSERVATION OF FRACTAL CROSSOVERS, AND COMPARISON WITH OTHER FRACTAL ANALYSIS TECHNIQUES, Journal of physical chemistry, 97(23), 1993, pp. 6255-6260
This paper applies the variographic technique developed in part 1 (pre
ceding paper in this issue) to a variety of surfaces. The results clea
rly show fractal regimes, and crossovers to nonfractal regimes, which
agree with independent measurements. The terraced surface of graphite
has nonfractal D = 2, until the onset at approximately 10(3) angstrom
of marginally fractal topography with 2.0 < D < 2.1. A rougher copper
surface also has nonfractal D = 2, until the onset at approximately 10
(2) angstrom of fractal topography with D = 2.1 2 +/- 0.03; then at ap
proximately 10(4) angstrom it reverts to D = 2, the result of polishin
g. A gold film shows nonfractal D = 2, until the onset at approximatel
y 10(3) angstrom of fractal topography with D = 2.39 +/- 0.05. In dire
ct comparison with other methods for fractal analysis (power spectrum,
perimeter-area, and structure function/single-image variogram methods
), this technique also performed the most reliably and informatively.