LOW-TEMPERATURE LIMITS OF DIAMOND FILM GROWTH BY MICROWAVE PLASMA-ASSISTED CVD

Citation
J. Stiegler et al., LOW-TEMPERATURE LIMITS OF DIAMOND FILM GROWTH BY MICROWAVE PLASMA-ASSISTED CVD, DIAMOND AND RELATED MATERIALS, 5(3-5), 1996, pp. 226-230
Citations number
21
Categorie Soggetti
Material Science
ISSN journal
09259635
Volume
5
Issue
3-5
Year of publication
1996
Pages
226 - 230
Database
ISI
SICI code
0925-9635(1996)5:3-5<226:LLODFG>2.0.ZU;2-J
Abstract
This paper describes the low temperature deposition (270-540 degrees C ) by microwave-plasma assisted chemical vapor deposition (CVD) of diam ond thin films using various gas mixtures. The substrate temperature w as controlled without adjusting other deposition parameters. It has be en observed that limits for low temperature growth of diamond films de pend substantially on the gas system employed as well as on the carbon concentration in the particular system. Generally, a characteristic t ransition from crystalline growth to deposits containing a strongly in creased amount of non-diamond carbon occurred when the deposition temp erature was lowered. This has been defined as the low temperature limi t of diamond film growth. The conventional CH4/H-2 systems have the hi ghest transition temperatures. The addition of oxygen permits him depo sition at lower substrate temperatures; the lowest have been realized in GO-rich systems. The dependency of the growth limits on crucial dep osition parameters is discussed in terms of abundant gas phase species and surface processes, in particular, the role of oxygen in the gas p hase and surface chemistry.