Disordered a-C:H and a-C:H:N layers with dispersed Ti atoms were prepa
red by d.c, unbalanced planar magnetron sputtering onto HSS substrates
covered by titanium buffer. Chemical composition of films was determi
ned by Rutherford backscattering analysis, structural aspects were stu
died by Raman spectroscopy. According to this, films prepared at tempe
ratures higher than 400 degrees C may be classified as glassy carbon.
The films exhibit very good overall adhesion and other mechanical prop
erties, though results of mechanical experiments are rather peculiar a
nd difficult to interpret: microhardness measurement gives unrealistic
results because of pronounced cracking in the direction of indenter's
diagonals and adhesion is influenced by coatings which are composed f
rom titanium buffer and carbon film, i.e. they are bi- layered.