Iy. Konyashin et Mb. Guseva, THIN-FILMS COMPARABLE WITH WC-CO CEMENTED CARBIDES AS UNDERLAYERS FORHARD AND SUPERHARD COATINGS - THE STATE-OF-THE-ART, DIAMOND AND RELATED MATERIALS, 5(3-5), 1996, pp. 575-579
A new method for deposition of barrier underlayers, which completely p
revent Co penetration to the substrate surface and are highly compatib
le with WC-Co cemented carbides, has been developed. It allows deposit
ion of thin hard continuous, highly adherent and defect-free TiCN-base
d films by the use of high energy titanium ions. The method ensures de
position without any damage of the cemented-carbide substrate or its d
ecarburization, leading to formation of the eta phase near the surface
layer. As a result, CVD TiC, TiCN, TiN etc. coatings can be deposited
onto cemented carbides preliminarily plated with barrier underlayers
almost without a decrease in transverse rupture strength. Special addi
tional interlayers are applied for enhancement of the adhesion between
the underlayers and plasma CVD diamond coatings, resulting in excelle
nt resistance of the near-surface layer of the cemented-carbide substr
ate with these coatings to high static loading when subjected to inden
tation.