Yj. Gao et I. Wolff, A NEW MINIATURE MAGNETIC-FIELD PROBE FOR MEASURING 3-DIMENSIONAL FIELDS IN PLANAR HIGH-FREQUENCY CIRCUITS, IEEE transactions on microwave theory and techniques, 44(6), 1996, pp. 911-918
A new noncontacting miniature magnetic field probe for measuring the s
urface current distribution on high-frequency planar circuits in x-, y
-, z-directions in the 1-20 GHz band has been designed, fabricated and
tested, The field probes have very small dimensions and do not need a
ny connection to the operating circuit under test, therefore there is
almost no perturbation of the circuit properties, This simple and prac
tical magnetic field probes can be used to assist the design of microw
ave circuits, antenna diagnostics and to test products in industry, Th
is paper describes the producing procedure of the magnetic field probe
s, a scanning diagnostic system, measurement examples and comparisons
between measurements and calculations. The measurement results agree v
ery well with theoretically expected field distributions.