A NEW MINIATURE MAGNETIC-FIELD PROBE FOR MEASURING 3-DIMENSIONAL FIELDS IN PLANAR HIGH-FREQUENCY CIRCUITS

Authors
Citation
Yj. Gao et I. Wolff, A NEW MINIATURE MAGNETIC-FIELD PROBE FOR MEASURING 3-DIMENSIONAL FIELDS IN PLANAR HIGH-FREQUENCY CIRCUITS, IEEE transactions on microwave theory and techniques, 44(6), 1996, pp. 911-918
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00189480
Volume
44
Issue
6
Year of publication
1996
Pages
911 - 918
Database
ISI
SICI code
0018-9480(1996)44:6<911:ANMMPF>2.0.ZU;2-S
Abstract
A new noncontacting miniature magnetic field probe for measuring the s urface current distribution on high-frequency planar circuits in x-, y -, z-directions in the 1-20 GHz band has been designed, fabricated and tested, The field probes have very small dimensions and do not need a ny connection to the operating circuit under test, therefore there is almost no perturbation of the circuit properties, This simple and prac tical magnetic field probes can be used to assist the design of microw ave circuits, antenna diagnostics and to test products in industry, Th is paper describes the producing procedure of the magnetic field probe s, a scanning diagnostic system, measurement examples and comparisons between measurements and calculations. The measurement results agree v ery well with theoretically expected field distributions.