OPEN-ENDED METALLIZED CERAMIC COAXIAL PROBE FOR HIGH-TEMPERATURE DIELECTRIC-PROPERTIES MEASUREMENTS

A metallized ceramic coaxial probe has been developed for high tempera ture complex permittivity measurements, The probe is made of alumina a nd metallized with a 3.0-mil-thick layer of moly-manganese, and a 0.5- mil-thick protective coating of nickel plating, It is shown that based on carrying out the network analysis calibration procedure up to 1000 degrees C, and on actual dielectric properties measurements, the prob e provides accurate dielectric measurements over a broad frequency ran ge (500 MHz to 3 GHz) and for temperatures up to 1000 degrees C. An un certainty analysis based on two different calibration techniques was a lso given to help quantity possible measurement errors.