DIELECTRIC-PROPERTIES OF TIO2-NB2O CRYSTALLOGRAPHIC SHEAR STRUCTURES

Citation
Rj. Cava et al., DIELECTRIC-PROPERTIES OF TIO2-NB2O CRYSTALLOGRAPHIC SHEAR STRUCTURES, Journal of materials research, 11(6), 1996, pp. 1428-1432
Citations number
9
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
11
Issue
6
Year of publication
1996
Pages
1428 - 1432
Database
ISI
SICI code
0884-2914(1996)11:6<1428:DOTCSS>2.0.ZU;2-5
Abstract
The dielectric constants (K) have been measured near ambient temperatu re for polycrystalline bulk ceramics of the crystallographic shear com pounds TiNb24O62, Ti2Nb10O29, and TiNb2O7. These show enhanced K's ove r Nb2O5 and TiO2, with the 2:10:29 phase displaying an ambient tempera ture K of approximately 130. We also report the effects of partial sub stitution of Nb by Ta. In general, thr dielectric constants are enhanc ed for 5-10% Ta substitution with the detailed behavior differing for the three phases.