We studied resistivity, magnetoresistivity, and Hall resistivity for a
few percolating granular NiFe-SiO2 films upon thermal annealing. It w
as found that both the resistivity and the Hall resistivity decrease b
y two orders of magnitude upon annealing at 520 degrees C, accompanied
by a crossover from an approximately -lnT dependence of resistivity t
o a metallic behavior. On the other hand, transmission electron micros
copy study showed that this pattern of resistivity and Hall resistivit
y change is not due to any new phases, but is associated with changes
in particle size distribution. These results cannot be understood in t
he existing theoretical framework.