A DESIGN OF REFLECTION SCANNING NEAR-FIELD OPTICAL MICROSCOPE AND ITSAPPLICATION TO ALGAAS GAAS HETEROSTRUCTURES/

Authors
GUTTROFF G KETO JM SHIH CK ANSELM A STREETMAN BG
Citation
G. Guttroff et al., A DESIGN OF REFLECTION SCANNING NEAR-FIELD OPTICAL MICROSCOPE AND ITSAPPLICATION TO ALGAAS GAAS HETEROSTRUCTURES/, Applied physics letters, 68(25), 1996, pp. 3620-3622
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
68
Issue
25
Year of publication
1996
Pages
3620 - 3622
Database
ISI
SICI code
0003-6951(1996)68:25<3620:ADORSN>2.0.ZU;2-B
Abstract
A scanning near-field microscope design using the reflected light inte nsity as the Feedback mechanism is described. Multiple fibers with hig h numerical apertures provide a high collection efficiency in a reflec tion geometry, The performance with regard to its response to large sp atial variations has been tested by using a Si-grating sample and with regard to variations of local indices of refraction by using GaAs/AlG aAs heterostructure samples, In addition, spatially resolved spectrosc opy on GaAs/AlGaAs heterostructures has been obtained. (C) 1995 Americ an Institute of Physics.