NANOMETER-SCALE SURFACE MODIFICATIONS OF YBA2CU3O7-DELTA THIN-FILMS USING A SCANNING TUNNELING MICROSCOPE

Citation
G. Bertsche et al., NANOMETER-SCALE SURFACE MODIFICATIONS OF YBA2CU3O7-DELTA THIN-FILMS USING A SCANNING TUNNELING MICROSCOPE, Applied physics letters, 68(25), 1996, pp. 3632-3634
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
68
Issue
25
Year of publication
1996
Pages
3632 - 3634
Database
ISI
SICI code
0003-6951(1996)68:25<3632:NSMOYT>2.0.ZU;2-9
Abstract
Systematic modifications on the nanometer scale of YBa2Cu3O7-delta (YB CO) epitaxial, thin films have been achieved by using a scanning tunne ling microscope in air at room temperature. Working with tunneling par ameters slightly above those used for imaging results in irreversible, nanometer-sized surface modifications. The surface topography of our YBCO films showed characteristic growth spirals, of which one revealed a remarkable ''S''-shaped top end. This unusual growth behavior indic ates possibly a distortion caused by a line defect in the second to la st turn of the spiral. We succeeded in cutting through this structure by producing a 2.5 nm wide groove across it. This corresponds to the c ontrolled removal of only a few unit cells of YBCO. As an alternative modification technique, bias voltage pulses were applied, leading to t he formation of 3 nm wide craters. (C) 1996 American Institute of Phys ics.