STRUCTURE OF CROSS-TIE WALL IN THIN CO FILMS RESOLVED BY MAGNETIC FORCE MICROSCOPY

We have studied the magnetic domain structure of a thin polycrystallin e Co film by magnetic force microscopy (MFM), Domain walls of the cros s-tie type have been observed for a Co film of 50 nm thickness, Due to the high lateral resolution of MFM we have been able to study the mag netic structure of a single cross tie. We have determined locations of Bloch lines within a domain wall comparing the experimental data with a theoretical model of a cross-tie wall. In order to explain our expe rimental results we have proposed a model for the interaction between a MFM tip and across-tie wall. (C) 1996 American Institute of Physics.