MICROSTRUCTURE OF TI3SIC2-BASED CERAMICS

The Ti3SiC2-based ceramic produced by self-propagating high-temperatur e synthesis (SHS) has been investigated by means of analytical electro n microscopy (AEM). The observations have proved that the elongated sl abs with rounded corners of well fused Ti3SiC2 grains form a matrix wi thin which some rounded TiC and less frequent angular SiC inclusions a re present. A TiSi2 phase filling up a remaining free space between ca rbide grains, has been also detected. The Ti3SiC2 grains are character ised by a high density of dislocations, while the TiC ones contain mos tly stacking faults. Cracks forming in the material are situated predo minantly at the Ti3SiC2/TiC interface.