INTERFACIAL ROUGHNESS OF PARTIALLY CORRELATED METALLIC MULTILAYERS STUDIED BY NON-SPECULAR X-RAY REFLECTIVITY

Citation
R. Paniago et al., INTERFACIAL ROUGHNESS OF PARTIALLY CORRELATED METALLIC MULTILAYERS STUDIED BY NON-SPECULAR X-RAY REFLECTIVITY, Physica. B, Condensed matter, 221(1-4), 1996, pp. 10-12
Citations number
7
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
09214526
Volume
221
Issue
1-4
Year of publication
1996
Pages
10 - 12
Database
ISI
SICI code
0921-4526(1996)221:1-4<10:IROPCM>2.0.ZU;2-B
Abstract
Using a two-dimensional image plate detector we measured the non-specu lar X-ray reflectivity from (Ni-0.81 Fe-0.19)/Au metallic multilayers. The image plate pattern consists of periodic diffuse sheets which ari se from the coherence of the roughness between different interfaces, a nd are strongest at the position of the Bragg peaks. We analyze the ex pression for the diffuse scattering cross-section derived from the dis torted-wave Born approximation and separate the coherent and incoheren t contributions, This allows us to determine the interface roughness p arameters, assuming it to be self-affine. From the line shape of the d iffuse sheets we determine the partial replication of the roughness fo r different length scales.