EPITAXY AT THE ORGANIC-INORGANIC INTERFACE

Citation
P. Fenter et al., EPITAXY AT THE ORGANIC-INORGANIC INTERFACE, Physica. B, Condensed matter, 221(1-4), 1996, pp. 145-151
Citations number
38
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
09214526
Volume
221
Issue
1-4
Year of publication
1996
Pages
145 - 151
Database
ISI
SICI code
0921-4526(1996)221:1-4<145:EATOI>2.0.ZU;2-C
Abstract
We describe an X-ray diffraction study of the epitaxy of organic thin films on well-defined inorganic substrates. These include alkyl-thiol monolayers (''self-assembled monolayers'') and films of PTCDA (3, 4, 9 , 10 perylenetetracarboxylic dianhydride) on Au(111) surfaces. Althoug h each of these films are grown by very different methods (liquid phas e self-assembly, versus molecular beam epitaxy), we find that the mole cular degrees of freedom have an important impact upon the film struct ure and its dependence upon the him thickness. We discuss the generali ty of these observation for organic/inorganic growth systems.