We describe an X-ray diffraction study of the epitaxy of organic thin
films on well-defined inorganic substrates. These include alkyl-thiol
monolayers (''self-assembled monolayers'') and films of PTCDA (3, 4, 9
, 10 perylenetetracarboxylic dianhydride) on Au(111) surfaces. Althoug
h each of these films are grown by very different methods (liquid phas
e self-assembly, versus molecular beam epitaxy), we find that the mole
cular degrees of freedom have an important impact upon the film struct
ure and its dependence upon the him thickness. We discuss the generali
ty of these observation for organic/inorganic growth systems.