D. Perahia et al., NEUTRON REFLECTIVITY OF END-GRAFTED POLYMERS IN POOR SOLVENT - KINETIC EFFECTS, Physica. B, Condensed matter, 221(1-4), 1996, pp. 337-341
Kinetics of adsorption of polymers on a solid surface in poor solvent
and the competition between long and short chains were studied using n
eutron reflectivity. A brush which consists of a 375 K deuterated poly
styrene terminated by a zwitterionic end group was grafted on a single
crystal silicon wafer from a protonated cyclohexane solution. We foun
d that the long deuterated polymer forms a density profile qualitative
ly similar to a 50 K protonated polymer studied previously. As for the
low molecular weight polymer, the profile consists of a denser layer
at the solid surface, a step-like profile convoluted with a Gaussian r
oughness and an exponential tail which stretches out almost to the len
gth of the same molecular weight in good solvent. Our results also sug
gest that the brush, formed in poor solvent, grows in islands and even
tually covers the entire surface. After equilibrium was reached, the b
rush formed by the 375 K polymer, was exposed to a low molecular weigh
t, 26 K protonated polymer. The profile of the long deuterated layer w
as studied as a function of time. In poor solvent, a new equilibrium i
s formed between the long and the short polymers where the exact compo
sition of the long and short chains depends on the temperature and the
ratio of the molecular weights.