ELECTRON-DENSITY MAPS FOR THE SI(1-1-1) 7X7 SURFACE CALCULATED WITH THE MAXIMUM-ENTROPY TECHNIQUE USING X-RAY AND ELECTRON-DIFFRACTION DATA

Citation
Cam. Carvalho et al., ELECTRON-DENSITY MAPS FOR THE SI(1-1-1) 7X7 SURFACE CALCULATED WITH THE MAXIMUM-ENTROPY TECHNIQUE USING X-RAY AND ELECTRON-DIFFRACTION DATA, Physica. B, Condensed matter, 221(1-4), 1996, pp. 469-486
Citations number
18
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
09214526
Volume
221
Issue
1-4
Year of publication
1996
Pages
469 - 486
Database
ISI
SICI code
0921-4526(1996)221:1-4<469:EMFTS7>2.0.ZU;2-R
Abstract
Maximum-entropy electron-density maps have been calculated for the fir st time for a two-dimensional surface structure using X-ray and electr on-diffraction data. The maps clearly resolve all the 102 atoms of the Takayanagi dimer-adatom-stacking-fault model. The atomic positions de termined from the map are in good agreement with those from a least-sq uares refinement, Electron bondings between atoms are not apparent in the maps due to insufficient data quality, The reliability of the maxi mum-entropy method is discussed, It is shown that the calculation proc edure must be continued to values of chi(2) < 1 in most cases, A metho d to estimate the uncertainty in the density values and to identify re liable features in the maps is presented. It is shown that the maximum -entropy method is a promising technique to obtain detailed structure information from a small number of accurate structure factors,