GLOBAL MINIMIZATION IN RECONSTRUCTION OF THE SCATTERING-LENGTH DENSITY PROFILE BY X-RAY REFLECTIVITY DATA

Authors
SAMOILENKO II SHCHEDRIN BM FEIGIN LA
Citation
Ii. Samoilenko et al., GLOBAL MINIMIZATION IN RECONSTRUCTION OF THE SCATTERING-LENGTH DENSITY PROFILE BY X-RAY REFLECTIVITY DATA, Physica. B, Condensed matter, 221(1-4), 1996, pp. 542-546
Citations number
7
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica. B, Condensed matter → ACNP
ISSN journal
09214526
Volume
221
Issue
1-4
Year of publication
1996
Pages
542 - 546
Database
ISI
SICI code
0921-4526(1996)221:1-4<542:GMIROT>2.0.ZU;2-F
Abstract
The method of the successive descent from local minima was applied to modeling of X-ray reflectivity data. The method showed its effectivity in finding better solutions of the inverse problem in reflectivity da ta fitting.