COMPLEX DYNAMICS OF CURRENT FILAMENTS IN THE LOW-TEMPERATURE IMPURITYBREAKDOWN REGIME OF SEMICONDUCTORS

Citation
G. Hupper et al., COMPLEX DYNAMICS OF CURRENT FILAMENTS IN THE LOW-TEMPERATURE IMPURITYBREAKDOWN REGIME OF SEMICONDUCTORS, Physical review. B, Condensed matter, 47(23), 1993, pp. 15515-15522
Citations number
35
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
47
Issue
23
Year of publication
1993
Pages
15515 - 15522
Database
ISI
SICI code
0163-1829(1993)47:23<15515:CDOCFI>2.0.ZU;2-0
Abstract
The formation of spatial and spatiotemporal patterns (current filament s) in semiconductors in the regime of low-temperature impurity impact ionization is investigated theoretically. Our model yields stable fila ments, breathing filaments, and traveling filaments which show an inte rmittent spatiotemporal instability, resulting in chaotic oscillations of the average carrier density and of the current. The crucial role o f the dielectric relaxation of the transverse electric field is single d out. Different strategies for the numerical treatment are discussed.