Y. Deslandes et al., X-RAY PHOTOELECTRON-SPECTROSCOPY AND STATIC TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY STUDY OF DISPERSION POLYMERIZED POLYSTYRENE LATEXES, Langmuir, 9(6), 1993, pp. 1468-1472
Dispersion polymerized polystyrene particles were prepared using poly(
N-vinylpyrrolidone) (PVP) as a steric stabilizer. The top surface comp
osition of a series of latex particles was analyzed using a combinatio
n of X-ray photoelectron spectroscopy (XPS) and time-of-flight seconda
ry ion mass spectrometry (TOF-SIMS). XPS of 6.5-mum micron particles r
evealed a top surface composition of 30% steric stabilizer, correspond
ing to either two monolayers (0.5-0.6 nm) of highly ordered PVP unifor
mly coating the particles or a patchy surface with islands of PVP on t
he polystyrene surface. The SIMS experiments showed a mixture of polys
tyrene and PVP in the very top layer, supporting the patchy model. Sim
ilar results were obtained for several 2.5-mum particles synthesized u
sing PVP in combination with Triton and Aerosol AOT ''costabilizers''.
The additional surfactants were not found on the surface. One sample
with a much higher polystyrene molecular weight had only 15 % PVP on t
he surface, suggesting that the majority of the surface polystyrene is
simply the anchoring block of the grafted PVP-PS. The results are qua
ntitatively consistent with the grafting mechanism of stabilization in
dispersion polymerization.