X-RAY PHOTOELECTRON-SPECTROSCOPY AND STATIC TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY STUDY OF DISPERSION POLYMERIZED POLYSTYRENE LATEXES

Citation
Y. Deslandes et al., X-RAY PHOTOELECTRON-SPECTROSCOPY AND STATIC TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY STUDY OF DISPERSION POLYMERIZED POLYSTYRENE LATEXES, Langmuir, 9(6), 1993, pp. 1468-1472
Citations number
26
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
07437463
Volume
9
Issue
6
Year of publication
1993
Pages
1468 - 1472
Database
ISI
SICI code
0743-7463(1993)9:6<1468:XPASTS>2.0.ZU;2-N
Abstract
Dispersion polymerized polystyrene particles were prepared using poly( N-vinylpyrrolidone) (PVP) as a steric stabilizer. The top surface comp osition of a series of latex particles was analyzed using a combinatio n of X-ray photoelectron spectroscopy (XPS) and time-of-flight seconda ry ion mass spectrometry (TOF-SIMS). XPS of 6.5-mum micron particles r evealed a top surface composition of 30% steric stabilizer, correspond ing to either two monolayers (0.5-0.6 nm) of highly ordered PVP unifor mly coating the particles or a patchy surface with islands of PVP on t he polystyrene surface. The SIMS experiments showed a mixture of polys tyrene and PVP in the very top layer, supporting the patchy model. Sim ilar results were obtained for several 2.5-mum particles synthesized u sing PVP in combination with Triton and Aerosol AOT ''costabilizers''. The additional surfactants were not found on the surface. One sample with a much higher polystyrene molecular weight had only 15 % PVP on t he surface, suggesting that the majority of the surface polystyrene is simply the anchoring block of the grafted PVP-PS. The results are qua ntitatively consistent with the grafting mechanism of stabilization in dispersion polymerization.