ATOMIC-FORCE MICROSCOPY OF AGBR CRYSTALS AND ADSORBED GELATIN FILMS

Citation
G. Haugstad et al., ATOMIC-FORCE MICROSCOPY OF AGBR CRYSTALS AND ADSORBED GELATIN FILMS, Langmuir, 9(6), 1993, pp. 1594-1600
Citations number
19
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
07437463
Volume
9
Issue
6
Year of publication
1993
Pages
1594 - 1600
Database
ISI
SICI code
0743-7463(1993)9:6<1594:AMOACA>2.0.ZU;2-C
Abstract
Atomic force microscopy of the (111) surface of macroscopic AgBr cryst als revealed steps ranging in height from two atomic layers up to 10 n m, lying predominantly along the [110] and [112] families of crystal d irections. Rods of elemental Ag, formed via photoreduction, were obser ved along the [110] family of directions. Images of adsorbed gelatin f ilms revealed circular pores with diameters of order 10-100 nm, extend ing to the AgBr surface. The length of deposition time, the pH and con centration of the gelatin solution, and the presence of steps on the A gBr surface were observed to affect the size, number, and location of pores in the gelatin films.