IN-SITU DIAGNOSTICS FOR PLASMA SURFACE PROCESSING

Citation
Gmw. Kroesen et Fj. Dehoog, IN-SITU DIAGNOSTICS FOR PLASMA SURFACE PROCESSING, Applied physics. A, Solids and surfaces, 56(6), 1993, pp. 479-492
Citations number
61
Categorie Soggetti
Physics, Applied
ISSN journal
07217250
Volume
56
Issue
6
Year of publication
1993
Pages
479 - 492
Database
ISI
SICI code
0721-7250(1993)56:6<479:IDFPSP>2.0.ZU;2-E
Abstract
A survey is given of in-situ diagnostic's of plasma and surface for ap plication in plasma etching and deposition. Especially those diagnosti cs that increase the fundamental understanding of the elementary proce sses occurring both within the plasma and at the surface are highlight ed. In general, diagnostics are performed to determine the value of a physical parameter. This value is fed into models of plasma or surface , and in that way the understanding of the process is enhanced. In the paper first the most interesting physical parameters are defined. Sub sequently the diagnostic techniques currently available to determine t hose parameters are reviewed.