REAL STRUCTURE OF SINGLE-CRYSTALS AND INT ENSITY OF BRAGG-REFLECTIONS

Single-crystal diffractometry can be used to characterize the defect s tructure of single-crystals up to the level of point defects. This pap er deals with the information content of integrated Bragg intensities of weak as well as of fundamental reflections. Experimental possibilit ies of conventional X-rays and synchrotron radiation are compared. The integrated Bragg intensity is an objective in materials science for t he development of high-efficiency monochromators. The importance of be ryllium-based materials for new synchrotron and neutron monochromators is discussed and first results are presented.