EQUAL-THICKNESS-FRINGE MULTIPLE REFLECTION INTERFEROMETER FOR ULTRA-HIGH-SPEED INTERFERENCE RECORDING

Authors
LU J NI XW HE AZ
Citation
J. Lu et al., EQUAL-THICKNESS-FRINGE MULTIPLE REFLECTION INTERFEROMETER FOR ULTRA-HIGH-SPEED INTERFERENCE RECORDING, Optical engineering, 35(6), 1996, pp. 1772-1774
Citations number
3
Categorie Soggetti
Optics
Journal title
Optical engineering → ACNP
ISSN journal
00913286
Volume
35
Issue
6
Year of publication
1996
Pages
1772 - 1774
Database
ISI
SICI code
0091-3286(1996)35:6<1772:EMRIFU>2.0.ZU;2-R
Abstract
An equal-thickness-fringe multiple reflection interferometer for ultra -high-speed multiframe recording is reported. The initial process of l aser-produced plasma on a dielectric film layer is explored using this interferometer, and five interferograms with 30-ns frame intervals ar e obtained. (C) 1996 Society of Photo-Optical instrumentation Engineer s.