Silica-based waveguiding layers are readily obtained by the spin-coati
ng of appropriate sols on silicon wafers. They may easily be doped wit
h rare earth elements, for intended applications such as lasers or amp
lifiers. The authors describe the preparation and characterisation of
such films. The film structure was investigated by X-ray photoelectron
spectroscopy (XPS), X-ray absorption spectroscopies (NEXAFS and EXAFS
) and Fourier transform infrared spectroscopy (FTIR). Their surface ar
ea, evaluated by Brunauer-Emmett-Teller (BET) analysis, and their poro
sity, estimated from refractive index measurements, are reported. Fina
lly, rare earth fluorescence lifetime data are presented and interpret
ed.