DETERMINATION OF STRUCTURAL PARAMETERS OF YBACUO THIN-FILMS BY HIGH-RESOLUTION X-RAY-DIFFRACTION METHODS

Authors
KYUTT RN ARGUNOVA TS
Citation
Rn. Kyutt et Ts. Argunova, DETERMINATION OF STRUCTURAL PARAMETERS OF YBACUO THIN-FILMS BY HIGH-RESOLUTION X-RAY-DIFFRACTION METHODS, Fizika tverdogo tela, 38(1), 1996, pp. 89-100
Citations number
13
Categorie Soggetti
Physics, Condensed Matter
Journal title
Fizika tverdogo tela → ACNP
ISSN journal
03673294
Volume
38
Issue
1
Year of publication
1996
Pages
89 - 100
Database
ISI
SICI code
0367-3294(1996)38:1<89:DOSPOY>2.0.ZU;2-R