DETERMINATION OF STRUCTURAL PARAMETERS OF GRADIENT EPITAXIAL LAYERS BY HIGH-RESOLUTION X-RAY-DIFFRACTION METHODS .2. SOLUTION OF REVERSE PROBLEM WITH KINEMATIC AND STATISTIC DYNAMIC DIFFRACTION THEORY

Citation
Vi. Punegov et al., DETERMINATION OF STRUCTURAL PARAMETERS OF GRADIENT EPITAXIAL LAYERS BY HIGH-RESOLUTION X-RAY-DIFFRACTION METHODS .2. SOLUTION OF REVERSE PROBLEM WITH KINEMATIC AND STATISTIC DYNAMIC DIFFRACTION THEORY, Fizika tverdogo tela, 38(1), 1996, pp. 264-271
Citations number
17
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
03673294
Volume
38
Issue
1
Year of publication
1996
Pages
264 - 271
Database
ISI
SICI code
0367-3294(1996)38:1<264:DOSPOG>2.0.ZU;2-0