THE W DEFECT IN N-TYPE INP

Citation
Vv. Peshev et Sv. Smorodinov, THE W DEFECT IN N-TYPE INP, Semiconductors, 30(6), 1996, pp. 520-522
Citations number
3
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
10637826
Volume
30
Issue
6
Year of publication
1996
Pages
520 - 522
Database
ISI
SICI code
1063-7826(1996)30:6<520:TWDINI>2.0.ZU;2-S
Abstract
The W defect in n-type InP-based Schottky diodes irradiated with elect rons is investigated. The defect is produced only in the space charge region and is a trap for five electrons. Two configurations were found for the defect: one configuration (A) manifests the properties of a c enter with a negative correlation energy. The transformation of the A configuration into a metastable B configuration is controlled by the l oss of two electrons. It is suggested that a W defect in the B configu ration consists of two fragments on which one and two electrons, respe ctively, are localized. (C) 1996 American Institute of Physics.