The spectral dependences of the piezobirefringence in CdTe is determin
ed for different crystallographic directions of uniaxial compression a
t T=77 K-the temperature at which the photosensitive heterostructures
CdxHg1-xTe/CdTe are actually used. The dispersion of the piezobirefrin
gence near the fundamental absorption edge at T=77 K is stronger than
at room temperature, and the piezobirefringence itself reaches a much
higher value. Near the fundamental absorption edge the phase differenc
e between the radiation components for polarization parallel and perpe
ndicular to the compression axis is a nonlinear function of the strain
. The dispersion of the piezobirefringence is analyzed theoretically i
n the four-band Kane model, taking into account the explicit form of t
he band spectrum and the wave functions of electrons and holes. The te
mperature dependence of the dispersion of the piezobirefringence is ex
plained. (C) 1996 American Institute of Physics.