STUDY OF THE NATURE OF SILICON BONDING IN MINERAL RAW-MATERIAL AND MANGANESE-BASED SLAG MELTS

The nature of silicon bonding in model specimens of the MnO - SiO2 and Mno - CaO - SiO2 systems. in oxide and carbonate manganese concentrat es, manganese low-phosphorus slag and final slags (products of melting metallic Mn and silicomanganese) was studied by the XPS technique. Th e change of binding energy and the chemical shift of the Si 2p core el ectron Levels are caused (1) by the SiO2 --> [SixOy](z-) transformatio n resulting in the formation of silicon-oxygen motives of various arra ngement in the sequence SiO2 --> [Si4O10](4-) --> [Si4O11](6-) --> [Si 2O6](4-) --> [Si5O15](10-) --> [Si2O7](6-) --> [SiO4](4-): (2) by the decrease in the number of bridge bonds; (3) by the increase of the eff ective and formal charges of the elementary tetrahedron. and (4) by th e increase in the number of ligands (cation-modifiers Mn, Ca, Mg, Fe) capable of forming the effective channels for removing the: excess ele ctron charge.