R. Marec et al., A STUDY INVOLVING THE DESIGN AND THE FABRICATION PROCESS ON THE SRAM BEHAVIOR DURING A DOSE-RATE EVENT, IEEE transactions on nuclear science, 43(3), 1996, pp. 851-857
The experimental results analysis of TS4T1601 SRAMs in standby mode an
d electrical simulations show that the SRAM design and some slight mas
k misalignments during the fabrication process are dominant factors co
ncerning the dose-rate upset patterns and thresholds.