MODIFICATION OF SINGLE EVENT UPSET CROSS-SECTION OF AN SRAM AT HIGH-FREQUENCIES

Authors
BUCHNER S CAMPBELL AB MCMORROW D MELINGER J MASTI M CHEN YJ
Citation
S. Buchner et al., MODIFICATION OF SINGLE EVENT UPSET CROSS-SECTION OF AN SRAM AT HIGH-FREQUENCIES, IEEE transactions on nuclear science, 43(3), 1996, pp. 924-930
Citations number
5
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
43
Issue
3
Year of publication
1996
Part
1
Pages
924 - 930
Database
ISI
SICI code
0018-9499(1996)43:3<924:MOSEUC>2.0.ZU;2-L
Abstract
Single event upset cross sections exhibit a clock frequency dependence , the origins of which have been investigated in a CMOS SRAM, both wit h a pulsed laser synchronized to the operation of the circuit and with a circuit simulator modeling program.