EXPERIMENTAL-EVIDENCE OF THE TEMPERATURE AND ANGULAR-DEPENDENCE IN SEGR

Authors
MOURET I CALVET MC CALVEL P TASTET P ALLENSPACH M LABEL KA TITUS JL WHEATLEY CF SCHRIMPF RD GALLOWAY KF
Citation
I. Mouret et al., EXPERIMENTAL-EVIDENCE OF THE TEMPERATURE AND ANGULAR-DEPENDENCE IN SEGR, IEEE transactions on nuclear science, 43(3), 1996, pp. 936-943
Citations number
11
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
43
Issue
3
Year of publication
1996
Part
1
Pages
936 - 943
Database
ISI
SICI code
0018-9499(1996)43:3<936:EOTTAA>2.0.ZU;2-4
Abstract
The temperature and angular dependence of Single-Event Gate Rupture (S EGR) experiments show that a normal incident favors SEGR and elevated temperature is insignificant. Both the oxide and substrate response pl ay a major role in determining the SEGR sensitivity.